Preface, page 639, 
Full Text PDF

Partial Probabilities of X-Ray Bremsstrahlung Transitions
R. Nietubyć, E. Sobczak, A. S̆imůnek, J. Vackár̆ and O. S̆ipr, page 841,  abstract   Full Text PDF
DOI: 10.12693/APhysPolA.91.841

Resonant Photoemission Study of Sn_0.96Gd_0.04Te
N. Orlowski, C. Janowitz, A. Müller, R. Manzke, B.J. Kowalski and B.A. Orłowski, page 847,  abstract   Full Text PDF
DOI: 10.12693/APhysPolA.91.847

Study of Photoelectron Emission Yield from Layered Structures in Presence of Resonance-Enhanced X-Ray Propagation Effect
J.B. Pełka, S. Lagomarsino, A. Cedola, S. Di Fonzo and W. Jark, page 851,  abstract   Full Text PDF
DOI: 10.12693/APhysPolA.91.851

Grazing Incidence X-Ray Reflectivity Study of MBE-Grown Co/Cu Multilayers
J.B. Pełka, L.T. Baczewski, A. Wawro and J. Domagała, page 859,  abstract   Full Text PDF
DOI: 10.12693/APhysPolA.91.859

Comparative Study of Si-2p Core-Excitation Spectra of SiX₄ Molecules (with X = H, D, F, Cl, Br)
R. Püttner, M. Domke and G. Kaindl, page 865,  abstract   Full Text PDF
DOI: 10.12693/APhysPolA.91.865

Determination by X-Ray Absorption of Redox Induced Structural Changes in Iron-Sulfur Cluster F_x in Photosystem I
I. Sagi, G. Bunker, Y. Hochman, C. Carmeli and M.T. Zeng, page 871,  abstract   Full Text PDF
DOI: 10.12693/APhysPolA.91.871

C₆₀FeC₆₀ Complexes in Fe Intercalated Fullerite Studied by X-Ray Absorption
E. Sobczak, A. Traverse, R. Nietubyć, Y. Swilem, P. Byszewski and D. Żymierska, page 877,  abstract   Full Text PDF
DOI: 10.12693/APhysPolA.91.877

X-Ray Absorption Studies of Fe_73.5Cu₁Nb₃Si_15.5B₇ Amorphous and Nanocrystalline Alloys
Y. Swilem, E. Sobczak, R. Nietubyć, A. Ślawska-Waniewska and E. Dynowska, page 883,  abstract   Full Text PDF
DOI: 10.12693/APhysPolA.91.883

Photoemission by Polarized X-Rays
I.S. Tilinin, page 887,  abstract   Full Text PDF
DOI: 10.12693/APhysPolA.91.887

Measurement of Infrared Transition Spectrum of Synchrotron Radiation Through Superconducting YBa₂Cu₃O_7-δ Film
S.I. Tyutyunnikov, V.N. Shaliapin and N. Scintee, page 893,  abstract   Full Text PDF
DOI: 10.12693/APhysPolA.91.893

Solid-State Solutions of TiO₂-SnO₂ and SrTiO₃-BaTiO₃
K. Zakrzewska, M. Radecka, P. Pasierb, M. Bućko, E. Urbaniec and J. Janas, page 899,  abstract   Full Text PDF
DOI: 10.12693/APhysPolA.91.899

Study of Si(111) Implanted with As Ions by X-Ray Diffraction and Grazing Incidence Methods
J.B. Pełka, J. Górecka, J. Auleytner, J. Domagała and J. Bąk-Misiuk, page 905,  abstract   Full Text PDF
DOI: 10.12693/APhysPolA.91.905

Effect of Doping on Ga_1-xAl_xAs Structural Properties
J. Bąk-Misiuk, J. Domagała, W. Paszkowicz, J. Trela, Z.R. Żytkiewicz, M. Leszczyński, K. Regiński, J. Muszalski, J. Härtwig and M. Ohler, page 911,  abstract   Full Text PDF
DOI: 10.12693/APhysPolA.91.911

Structure Refinement of Amorphous Cd-As by Analysis of Partial Radial Distribution Functions
A. Burian, page 917,  abstract   Full Text PDF
DOI: 10.12693/APhysPolA.91.917

Photoelectron Emission Microscopy and its Application to the Study of Polymer Surfaces
A. Cossy-Favre, J. Diaz, S. Anders, H. Padmore, Y. Liu, M. Samant, J. Stöhr, H. Brown and T.P. Russell, page 923,  abstract   Full Text PDF
DOI: 10.12693/APhysPolA.91.923

Structural Perfection of Czochralski Grown Silicon Crystals Annealed above 1500 K under Hydrostatic Pressure
L. Datsenko, V. Khrupa, S. Krasulya, A. Misiuk, J. Härtwig and B. Surma, page 929,  abstract   Full Text PDF
DOI: 10.12693/APhysPolA.91.929

Integral Structure Perfection Diagnostics of Single Crystals Using Two Wavelengths of X-Ray Spectrum
L. Datsenko, S. Krasulya, V. Machulin, J. Auleytner and V. Khrupa, page 935,  abstract   Full Text PDF
DOI: 10.12693/APhysPolA.91.935

High Pressure - High Temperature Diffraction Study of MnTe Using Synchrotron Radiation
W. Paszkowicz, E. Dynowska and T. Peun, page 939,  abstract   Full Text PDF
DOI: 10.12693/APhysPolA.91.939

X-Ray Lasers, Operation and Applications
H. Fiedorowicz, page 945,  abstract   Full Text PDF
DOI: 10.12693/APhysPolA.91.945

X-Ray Diffraction and NMR Studies on Mixtures of Non-Ionic Surfactant (C₁₂EO₂) and Phospholipids (POPC)
S.S. Funari, C. di Vitta and G. Rapp, page 953,  abstract   Full Text PDF
DOI: 10.12693/APhysPolA.91.953

Optimization of Azimuthal Scan Procedure for Absolute Structure Determination
J. Grochowski and P. Serda, page 961,  abstract   Full Text PDF
DOI: 10.12693/APhysPolA.91.961

Solid State Ion Exchange Reactions of Co with Zeolites
A. Jentys, A. Lugstein and H. Vinek, page 969,  abstract   Full Text PDF
DOI: 10.12693/APhysPolA.91.969

X-MCD Study of Expanded Lattice Permanent Magnet Materials
Cz. Kapusta, R. Mycielski, B. Porębska, D. Ahlers, K. Attenkofer, P. Fischer and G. Schütz, page 975,  abstract   Full Text PDF
DOI: 10.12693/APhysPolA.91.975

X-Ray Structure Perfection Diagnostics of Slightly Distorted Silicon Crystals in the Bragg Case of Diffraction
V. Khrupa, S. Krasulya, V. Machulin, L. Datsenko and J. Auleytner, page 981,  abstract   Full Text PDF
DOI: 10.12693/APhysPolA.91.981

Defect Structure of Pressure Treated Czochralski Grown Silicon Investigated by X-Ray Topography and Diffractometry
A. Misiuk, J. Härtwig, E. Prieur, M. Ohler, J. Bąk-Misiuk, J. Domagała and B. Surma, page 987,  abstract   Full Text PDF
DOI: 10.12693/APhysPolA.91.987

High-Pressure Diffraction Study of Ga_1-xAl_xAs
W. Paszkowicz, E. Dynowska, Z.R. Żytkiewicz, D. Dobosz and J.W. Otto, page 993,  abstract   Full Text PDF
DOI: 10.12693/APhysPolA.91.993

X-Ray Characterization of GaAs:Zn Gas-transport Grown Whiskers Using Conventional and Synchrotron Sources
W. Paszkowicz, J. Górecka, J. Domagała, N. Dmitruk, S.S. Varshava, J. Härtwig, M. Ohler and A. Pietraszko, page 997,  abstract   Full Text PDF
DOI: 10.12693/APhysPolA.91.997

Physical Properties of AlGaAs Epilayers Subjected to High Pressure - High Temperature Treatment
W. Szuszkiewicz, W. Gębicki, J. Bąk-Misiuk, J. Domagała, M. Leszczyński and J. Hartwig, page 1003,  abstract   Full Text PDF
DOI: 10.12693/APhysPolA.91.1003

Scanning Force Microscopy on Laser Ablated Silicon Nitride Films
C. Vrînceanu, C. Flueraru, M. Dinescu and E. Vasile, page 1009,  abstract   Full Text PDF
DOI: 10.12693/APhysPolA.91.1009

Synchrotron White Beam Topographic Studies of Gallium Arsenide Crystals
W. Wierzchowski, K. Wieteska and W. Graeff, page 1015,  abstract   Full Text PDF
DOI: 10.12693/APhysPolA.91.1015

Interference Fringes in Synchrotron Section Topography of Implanted Silicon with a Very Large Ion Range
K. Wieteska, W. Wierzchowski, W. Graeff and K. Dłużewska, page 1021,  abstract   Full Text PDF
DOI: 10.12693/APhysPolA.91.1021

Comparative Studies of Surface Roughness of Thin Epitaxial Si Films by Computer Simulations and Experimental X-Ray and Optical Methods
D. Żymierska, J. Auleytner, J. Domagała, A. Szewczyk and N. Dmitruk, page 1025,  abstract   Full Text PDF
DOI: 10.12693/APhysPolA.91.1025