Integral Structure Perfection Diagnostics of Single Crystals Using Two Wavelengths of X-Ray Spectrum |
| L. Datsenko, S. Krasulya, V. Machulin Institute of Semiconductor Physics, National Academy of Sciences of Ukraine Kiev, Ukraine J. Auleytner Institute of Physics, Polish Academy of Sciences, Al. Lotników 32/46, 02-668 Warsaw, Poland and V. Khrupa Department of Physics, Science Laboratories, University of Durham Durham, South Road, DH1 3LE, U.K. |
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| A new approach to determination of microdefect structure parameters by means of single crystal diffractometer is proposed. The approach is based on the measurements of the integral reflectivity of a sample for two selected X-ray wavelengths providing with the approximations of thin and thick crystal, respectively. |
| DOI: 10.12693/APhysPolA.91.935 PACS numbers: 81.40.-z, 61.10.-i |