Fundamentals of the Synchrotron Radiation Facility Construction
M. Eriksson, page 449,  abstract   Full Text PDF
DOI: 10.12693/APhysPolA.86.449

Characterization of Concave-Curved Spectrometers for 2D X-Ray Optics
F.N. Chukhovskii, W.Z. Chang and E. Förster, page 463,  abstract   Full Text PDF
DOI: 10.12693/APhysPolA.86.463

Imaging Plates in Synchrotron and Conventional X-Ray Crystallographic Data Collection
Z. Dauter and K.S. Wilson, page 477,  abstract   Full Text PDF
DOI: 10.12693/APhysPolA.86.477

High Energy Resolution Photoemission Beam Line at ELETTRA
C. Quaresima, C. Ottaviani, M. Matteucci, C. Crotti, A. Antonini, M. Capozi, S. Rinaldi, M. Luce, P. Perfetti, K.C. Prince, C. Astaldi, M. Zacchigna, L. Romanzin and A. Savoia, page 487,  abstract   Full Text PDF
DOI: 10.12693/APhysPolA.86.487

Single-Crystal X-Ray Diffractometry Using Synchrotron Radiation
K. Eichhorn and K. Hümmer, page 497,  abstract   Full Text PDF
DOI: 10.12693/APhysPolA.86.497

Origin of the Surface Sensitivity in Surface X-Ray Diffraction
I. Robinson, P. Eng and R. Schuster, page 513,  abstract   Full Text PDF
DOI: 10.12693/APhysPolA.86.513

Magnetic X-Ray Scattering
C. Vettier, page 521,  abstract   Full Text PDF
DOI: 10.12693/APhysPolA.86.521

Application of Synchrotron X-Ray Topography to the Study of Materials
B.K. Tanner, page 537,  abstract   Full Text PDF
DOI: 10.12693/APhysPolA.86.537

X-Ray Topography Using Synchrotron Radiation
K. Wieteska, page 545,  abstract   Full Text PDF
DOI: 10.12693/APhysPolA.86.545

X-Ray Standing Waves: a Powerful Tool for Interface Studies
S. Lagomarsino, F. Scarinci, P. Castrucci and C. Giannini, page 553,  abstract   Full Text PDF
DOI: 10.12693/APhysPolA.86.553

X-Ray and Electron-Optical Characterization of ZnTe/CdTe and ZnTe/GaAs Epitaxial Layers Obtained by the MBE Method
J. Auleytner, Z. Dziuba, J. Górecka, J. Pełka and K. Regiński, page 567,  abstract   Full Text PDF
DOI: 10.12693/APhysPolA.86.567

Composition Determination of Some A^IIB^VI Ternary Semiconductors from Quasi-Forbidden Reflection Intensity
J. Bąk-Misiuk, J. Domagała, E. Dynowska, S. Miotkowska and W. Paszkowicz, page 575,  abstract   Full Text PDF
DOI: 10.12693/APhysPolA.86.575

Structure Perfection Diagnostics of Single Crystals by Means of Diffractometry Measurements Using X-Ray Continuous Spectrum
L.I. Datsenko and V.I. Khrupa, page 579,  abstract   Full Text PDF
DOI: 10.12693/APhysPolA.86.579

Influence of Preannealing on Perfection of Czochralski Grown Silicon Crystals Subjected to High Pressure Treatment
L.I. Datsenko, A. Misiuk, J. Härtwig, A. Briginets and V.I. Khrupa, page 585,  abstract   Full Text PDF
DOI: 10.12693/APhysPolA.86.585

Rapid Structure Perfection Diagnostics of GaAs Single Crystal by Diffraction of White X-Ray Radiation
V.I. Khrupa, D.O. Grigoryev, M.Ya. Skorokhod, L.I. Datsenko and J. Bąk-Misiuk, page 591,  abstract   Full Text PDF
DOI: 10.12693/APhysPolA.86.591

Structure Perfection Study of Crystals Containing Micro- and Macrodistortions by X-Ray Acoustic Method
V.I. Khrupa, D.O. Grigoryev and A.Ya. Dzyublik, page 597,  abstract   Full Text PDF
DOI: 10.12693/APhysPolA.86.597

Structural Properties of Cd_1-xMg_xTe and Cd_1-x-yMg_xMn_yTe Crystals
S. Miotkowska, E. Dynowska and I. Miotkowski, page 605,  abstract   Full Text PDF
DOI: 10.12693/APhysPolA.86.605

Stereoscopic Observation of Synthetic Diamond with Haruta Stereo-Pairs of Synchrotron Transmission Double-Crystal Topographs
M. Moore, A.R. Lang and W. Wierzchowski, page 613,  abstract   Full Text PDF
DOI: 10.12693/APhysPolA.86.613

Austenite Stabilization of Fe-Ni Alloy
V.E. Danilchenko and A.V. Nedolya, page 617,  abstract   Full Text PDF
DOI: 10.12693/APhysPolA.86.617

X-Ray Study of Synthetic Alunite
W. Paszkowicz, E. Dynowska and J. Świerkocki, page 621,  abstract   Full Text PDF
DOI: 10.12693/APhysPolA.86.621

Investigation of Crystal and Magnetic Structure of BiFeO₃ Using Neutron Diffraction
I. Sosnowska , R. Przeniosło, P. Fischer and V.A. Murashov, page 629,  abstract   Full Text PDF
DOI: 10.12693/APhysPolA.86.629

Interpretation of Differential Anomalous X-Ray Scattering Data for Amorphous Cd-As
A. Burian, P. Lecante, A. Mosset, J. Galy, J.M. Tonnerre and D. Raoux, page 633,  abstract   Full Text PDF
DOI: 10.12693/APhysPolA.86.633