Composition Determination of Some AIIBVI Ternary Semiconductors from Quasi-Forbidden Reflection Intensity
J. Bąk-Misiuk, J. Domagała, E. Dynowska, S. Miotkowska and W. Paszkowicz
Institute of Physics, Polish Academy of Sciences, Al. Lotników 32/46, 02-668 Warszawa, Poland
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The aim of the present paper is to study the possibility of application of the X-ray quasi-forbidden reflection method to the composition determination of the sphalerite-type Cd1-xMxTe = Mg, Zn, Mn) single crystals. The method is based on the property of quasi-forbidden reflections that their integral intensity is very sensitive to composition and weakly sensitive to crystal lattice defects. An example of application for a Cd1-xMnxTe single crystal is presented.
DOI: 10.12693/APhysPolA.86.575
PACS numbers: 61.10.Wg