Structure Perfection Diagnostics of Single Crystals by Means of Diffractometry Measurements Using X-Ray Continuous Spectrum |
| L.I. Datsenko and V.I. Khrupa Institute of Semiconductor Physics, National Academy of Sciences, Prosp. Nauki 45, 252028 Kiev, Ukraine |
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| Determination of the integral characteristics of structural perfection of a real crystal (i.e. Debye-Waller's static factor e-L and coefficient of absorption lids due to diffuse scattering) is especially expedient using the suitably selected wavelengths of the X-ray continuous spectrum by investigation of the thickness I(t), coordinate I(x) as well as amplitude I(W) dependencies of intensities at Lane or Bragg diffraction. Here W is an amplitude of weak ultrasound vibrations excited in a sample for suppression of the Bragg component of reflectivity. |
| DOI: 10.12693/APhysPolA.86.579 PACS numbers: 81.40.-z, 61.66.Bi, 61.72.Dd |