X-Ray Standing Waves: a Powerful Tool for Interface Studies |
| S. Lagomarsino, F. Scarinci Istituto Elettronica Stato Solido, CNR, V. Cineto Romano, 42 00156 Rome, Italy P. Castrucci Phys. Dep., Univ. Camerino, 62032 Camerino, Italy and C. Giannini CNRSM, 72023 Mesagne, Italy |
| Full Text PDF |
| The X-ray standing wave technique has demonstrated in these last years to be a powerful method in the study of interfaces. In this paper the fundamentals of the technique will be given, together with examples of applications in the field of metal-semiconductor, of buried semiconductor-semiconductor interfaces and in structural studies of Langmuir-Blodgett films. |
| DOI: 10.12693/APhysPolA.86.553 PACS numbers: 07.85.+n, 61.10.Lx, 68.35.-p |