X-Ray Optics for Synchrotron Radiation
C. Malgrange
Laboratoire de Minéralogie-Cristallographie, associé au CNRS, Universités Paris 6 and 7, 4 pl. Jussieu, 75252 Paris Cedex 05, France
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This paper presents the main optical devices used to prepare a beam from X-ray synchrotron source: monochromators, flat or curved in order to intercept a larger angular divergence at the sample, mirrors and, finally, optics for polarized X-ray experiments. Since X-ray optics is based either on total reflection or on diffraction by perfect crystals, the basic fundamental results of X-ray dynamical theory, which are necessary to understand the reasons why one device should be chosen rather than the other, are also presented.
DOI: 10.12693/APhysPolA.82.13
PACS numbers: 61.10.Dp, 78.90.+t