ACTA

Elemental Composition, Topography and Wettability of Pb_xSn_{1 - x}S Thin Films

I.S. Tashlykov^a, A.I. Turavets^a, V.F. Gremenok^b and P. Żukowski^c
^aBelarusian State Pedagogical University, Minsk, Belarus
^bScientific and Practical Materials Research Centre of the NAS of Belarus, Minsk, Belarus
^cLublin University of Technology, Lublin, Poland

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PbSnS thin films were prepared by hot-wall vacuum evaporation. The Rutherford backscattering technique was employed for the investigation of Pb_xSn_{1 - x}S thin films composition. With a help of atomic force microscopy the main stages in the development of the thin films were characterized. Contact angle measurements of water drop on Pb_xSn_{1 - x}S thin films have been conducted on our original setup.

DOI: 10.12693/APhysPolA.125.1339
PACS numbers: 68.37.Ps, 06.30.Bp