Electrical Characterizations of Schottky Diodes on ITO Modified by Aromatic SAMs
A.K. Havarea, S. Okurb, N.T. Yagmurcukardesc, M. Cand, H. Aydinc, M. Sekere and S. Demicb
aToros University, Faculty of Engineering, Mersin, Turkey
bIzmir Katip Celebi University, Material Science and Engineering, Çiğli, İzmir, Turkey
cIzmir Institute of Technology, Faculty of Science, Material Science and Engineering, Izmir, Turkey
dInstitute of Solar Energy, Ege University, Izmir, Turkey
eOndokuz Mayıs University, Science and Arts Faculty, Department of Physics, Samsun, Turkey
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In order to understand the electronic properties of the organic Schottky diode, ITO/TPD/Al and ITO/SAM/TPD/Al organic Schottky devices were fabricated to obtain current-voltage characteristics. From the slopes and y-axis intercepts of the plots, the values of the ideality factor, barrier heights of the ITO/SAM/TPD/Al diode were determined as 2.03 and 0.56 eV, respectively. The surface characterizations of modified and unmodified ITO were performed via atomic force microscopy.

DOI: 10.12693/APhysPolA.123.456
PACS numbers: 73.20.Hb, 73.20.Mf, 73.21.-b, 73.22.-f, 73.25.+i, 73.40.Ei, 73.40.Jn, 73.40.Ns