The Fast Differential Amplifier-Based Integrated Circuit Yield Analysis Technique
A. Baskysa, b, R. Navickasb and C. Simkeviciusa
aCenter for Physical Sciences and Technology, A. Gostauto 11, 01108 Vilnius, Lithuania
bVilnius Gediminas Technical University, Naugarduko 41, LT-03227 Vilnius, Lithuania
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The fast differential amplifier-based integrated circuit yield analysis technique, which enables determining the interrelation between the integrated circuit yield and dimensions of circuit elements, has been presented. The technique is based on the common use of experimental statistical analysis and statistical modeling as well as on the introduction of the concept of the integrated circuit intermediate parameters. The results of yield analysis of the concrete integrated circuit based on the differential amplifiers are presented.
DOI: 10.12693/APhysPolA.119.259
PACS numbers: 85.30.De, 85.30.Pq, 85.40.Bh, 85.40.Qx