Thickness Dependence of Effective Critical Exponents in Three-Dimensional Ising Plates
M.I. Marqués and J.A. Gonzalo
Departamento de Fisica de Materiales, C-IV Universidad Autónoma de Madrid, 28049 Madrid, Spain
Received: October 20, 1999; revised version January 17, 2000
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Phase transitions in Ising plates of equal area and different thicknesses have been studied by the Monte Carlo approach. The evolution of the critical temperature and of the effective critical exponents with the thickness of the lattice has been numerically determined. The thickness dependence of the maximum value of the effective critical exponents is well described by an exponential decay towards the respective three-dimensional value.
DOI: 10.12693/APhysPolA.97.1033
PACS numbers: 75.10.Hk, 64.60.Fr, 75.70.-i, 02.50.Ng