The Improvement of Atomic Force Microscope Suitable for Magnetic Domain Structure Measurements |
| I. Sveklo, W. Dobrogowski, M. Kisielewski and A. Maziewski Institute of Physics of Bialystok University, Lipowa 41, 15-424 Bialystok, Poland |
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| Based on commercial Burleigh METRISTM-2000 Atomic Force Microscope two methods of magnetic force measurements were realised. The developed system was successfully applied for study of magnetic structure of both YIG-garnet and CoNi/Pt magneto-optic multilayers. |
| DOI: 10.12693/APhysPolA.97.527 PACS numbers: 75.70.-i, 75.30.Pd, 61.16.Ch |