Speed-Dependent Effects on the 748.8 nm Ne Self-Broadened Line
R. Ciuryło, A. Bielski, S. Brym, J. Domysławska, D. Lisak, J. Szudy and R.S. Trawiński
Institute of Physics, Nicholas Copernicus University, Grudziądzka 5/7, 87-100 Toruń, Poland
Received: April 26, 1999; in final form July 13, 1999
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Profiles of the self-broadened 748.8 nm Ne line emitted from a glow discharge in neon in the pressure range between 0.8 and 100 Tr were measured using an improved experimental setup with pressure-scanned Fabry-Perot interferometer. First, line profiles were analysed using an ordinary Voigt procedure which yielded the Doppler widths decreasing with the increase in neon pressure. Using a speed-dependent Voigt profile it was shown that for the 748.8 nm line the correlation between the Doppler and collisional broadening plays an important role. However, the values of the pressure broadening and shift coefficients determined by the speed-dependent Voigt analysis were found to be only slightly different from those obtained by the ordinary Voigt analysis. A systematic error in the determination of perturber concentration in our previous investigation was corrected.
DOI: 10.12693/APhysPolA.96.359
PACS numbers: 32.70.-n, 33.70.-w, 34.20.-b