Role of Ionic Processes in Degradation of Wide-Gap II-VI Semiconductor Materials
L.V. Borkovskaya, B.R. Dzhymaev, N.E. Korsunskaya, I.V. Markevich, A.F. Singaevsky and M.K. Sheinkman
Institute of Semiconductor Physics, National Academy of Sciences of Ukraine, Prospect Nauki 45, Kiev, 252028, Ukraine
Full Text PDF
A role of mobile defects in processes responsible for II-VI compound semiconductor characteristic instability is under consideration. These defects have been shown to be responsible for electron-enhanced reactions in these materials, in particular, shallow donor creation in CdS crystals. Accumulation of mobile defects near dislocations results in some specific effects: anisotropy of conductivity induced by electric field and distortion of edge emission spectrum shape. These effects side by side with electron-enhanced defect reactions have been found to influence considerably semiconductor device characteristics.
DOI: 10.12693/APhysPolA.94.255
PACS numbers: 71.55.Jv, 78.55.Et