Applications of Scanning Tunneling Microscopy To Solid State Physics
H. van Kempen, E.J.G. Boon, M.C.M.M. van der Wielen, J.W.G. Wildöer, M.W.J. Prins, R. Jansen and R. Schad
Research Institute for Materials, University of Nijmegen, Toernooiveld 1, 6525 ED Nijmegen, The Netherlands
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Due to the dependence of the tunnel current to material properties like work function, density of states, and spin polarization the scanning tunneling microscope can be used to study a number of solid state physics problems. This will be illustrated with some examples. The presented examples have in common that also the role of the tip properties have to be taken explicitly into account.
DOI: 10.12693/APhysPolA.93.323
PACS numbers: 61.16.Ch, 68.35.Dv, 71.55.Eq