Local Adhesive Surface Properties Studied by Force Microscopy
M. Lekka, J. Lekki, M. Marszałek, Z. Stachura
Institute of Nuclear Physics, Radzikowskiego 152, 32-341 Cracow, Poland

and B. Cleff
Institute of Nuclear Physics, Wilhelm-Klemm-Str. 9, 48-149 Münster, Germany
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Scanning force microscopy was used in the contact mode to determine the adhesion force between a mica surface and a silicon nitride tip. The measurements were performed in an aqueous solution of sodium and calcium chlorides. The adhesion force according to the Derjaguin-Landau-Verwey- Overbeek theory depends on the competition between two kinds of forces: van der Waals and electrostatic "double layer". Two different curves of adhesion force versus salt concentration were obtained from the experiment with monovalent and divalent ions. The tip-surface adhesion force was determined from a statistical analysis of data obtained from the force vs. distance retracting curves.
DOI: 10.12693/APhysPolA.93.421
PACS numbers: 68.35.Gy