Substrate-Induced Strain in Epitaxial Lead Chalcogenides by Galvanomagnetic Effect Rotational Dependence |
| N.N. Berchenko, O.A. Dobriansky, A.V. Korovin, A.Yu. Nikiforov, V.S. Yakovyna "Lviv Polytechnic" State University, 12 Bandera St, 290646 Lviv, Ukraine and H. Zogg AFIF at Swiss Federal Institute of Technology, Technopark ETH-Teil, 8005 Zürich, Switzerland |
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| On the example of the PbTe and Pb0.77Sn0.23Te on BaF2 the possibility of using the weak magnetic field resistance technique for the evaluation of mismatch-thermally induced strains in semiconductors with multivalley band structure is discussed. |
| DOI: 10.12693/APhysPolA.92.715 PACS numbers: 72.20.My, 72.80.Jc |