Isovalence Substitutions in Multicomponent Aluminates ABCO4
L. Komissarova, G. Zimina, F. Spiridonov, G. Pushkina
Lomonossov Moscow State University, 119899 GSP-3 Moscow, Russia

A. Gloubokov and A. Pajączkowska
Institute of Electronic Material Technology, Wólczyńska 133, 01-919 Warsaw, Poland
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The crystallochemical characteristics of polycrystalline samples, Sr1-xLaxAlO4, Sr1-xΝdxΑlO4 (x = 0.02+0.20) and Sr1-xBixNdΑlO4 (x = 0.05 ÷ 0.50) prepared by the oxalate coprecipitation and cryochemical technique have been investigated. The existence limits of single-phase states for pairs of elements Sr-Pb (x < 0.05) and Nd-Bi (x < 0.2) were determined. The microprobe X-ray analysis showed the Bi uniform distribution. The dielectric properties of pure SrLaΑlO4, SrLaGaO4 and partial replacement La → Nd samples were measured. It can be concluded that these compounds are suitable as substrate materials of HTSC thin films.
DOI: 10.12693/APhysPolA.92.248
PACS numbers: 77.84.Βw