X-Ray Diffraction Investigations of NdGaO3 Single Crystal |
| K. Mazur, J. Sass, W. Giersz Institute of Electronic Materials Technology, Wólczyńska 133, 01-919 Warsaw, Poland P. Reiche Institut für Kristallzüchtung, Rudower Chaussee 6, 12-489 Berlin, Germany and N. Schell Institut für Ionenstrahlphysik und Materialforschung des Forschungszentrum Rossendorf, 01314 Dresden, Germany |
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| Neodymium gallium perovskite single crystals grown with the Czochralski method were examined with several complementary X-ray methods. By means of X-ray diffraction topography and reciprocal space diagram the structural perfection and crystal homogeneity of the studied wafers were determined. Additionally, the results of the X-ray reflectometry investigations of the surface perfection after the mechanochemical treatment are presented. |
| DOI: 10.12693/APhysPolA.92.226 PACS numbers: 81.10.Fq, 68.35.Bs, 61.50.Ks |