Photoexcitation Spectroscopy and Material Alteration with Free-Electron Laser
J. Sturmann, R.G. Albridge, A.V. Barnes, J. Gilligan, M.T. Graham, J.T. Mckinley, A. Ueda, W. Wang, X. Yang, N.H. Tolk
Center For Molecular and Atomic Studies and Surfaces, Department of Physics and Astronomy, Vanderbilt University, Box 1807-B, Nashville, TN 37235, USA

J.L. Davidson
Department of Applied and Engineering Sciences, Vanderbilt University, Box 99-B, Nashville, TN 37235, USA

and G. Margaritondo
Institut de Physique Appliquée, École Polytechnique Fédérale, 1015 Lausanne, Switzerland
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As synchrotron radiation sources have been used for many experiments in the ultraviolet and X-ray regimes, the free-electron laser is an excellent source for a wide array of infrared-photon projects and applications. The free-electron laser delivers a beam of powerful tunable pulsed radiation which provides the opportunity for spatial and temporal localization of the energy delivered at any desired wavelength within the 2-10 μ regime. One application discussed employs the free-electron laser for spectroscopy as a probe of electronic and vibrational structures. Another application uses the free-electron laser beam as a tool for altering materials in a fundamentally new way.
DOI: 10.12693/APhysPolA.91.689
PACS numbers: 63.20.-e, 73.20.At, 79.20.Ds, 79.20.La, 79.60.Jv