Dependence of Bilinear and Biquadratic Interlayer coupling on Thickness of Magnetic Films
J. Barnaś
Institute of Physics, A. Mickiewicz University, Matejki 48/49, 60-769 Poznań, Poland
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The dependence of bilinear and biquadratic interlayer coupling on the thickness of magnetic films is analysed for a trilayer structure with specular reflection at the outer surfaces. It is shown that the oscillation periods corresponding to the case where the thickness of one of the two magnetic films is constant, while that of the second one is varied, can be different from the oscillation periods in the case where the thicknesses of both magnetic films vary simultaneously. The nonoscillatory component of the coupling parameter is shown to be weakly dependent on the thickness of the magnetic films.
DOI: 10.12693/APhysPolA.91.257
PACS numbers: 75.30.Et