STM/AFM Observations of Co/Cu Magnetic Multilayers
M. Aleszkiewicza, R. Kalinowskia, R. Czajkab, W. Polewskab, A. Wawroa, L.T. Baczewskia and J. Raułuszkiewicza
aInstitute of Physics, Polish Academy of Sciences, Al. Lotników 32/46, 02-668 Warsaw, Poland
bInstitute of Physics, Poznań Technical University, Piotrowo 3, 60-965 Poznań, Poland
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UHV deposited magnetic Co/Cu multilayers were investigated by means of scanning tunneling microscopy (STM) and atomic force microscopy (AFM). Surface of the sample i.e. upper covering layer in "plane" configuration and individual sublayers in "cross-section" configuration were investigated. A possibility of structure characterization of metallic multilayers by STM and AFM in the cross-section configuration is demonstrated.
DOI: 10.12693/APhysPolA.91.311
PACS numbers: 68.65.+g, 61.16.Ch, 68.55.Jk