Dimensional Crossovers in Magnetoresistance of Submicron Films and Wires of CdTe:In
J. Jaroszyński, J. Wróbel, M. Sawicki, T. Skośkiewicz, G. Karczewski, T. Wojtowicz, J. Kossut, T. Dietl
Institute of Physics, Polish Academy of Sciences, Al. Lotników 32/46, 02-668 Warszawa, Poland

E. Kamińska, E. Papis, A. Piotrowska
Institute of Electron Technology, Al. Lotników 32/46, 02-668 Warszawa, Poland

R. Duś and R. Nowakowski
Institute of Physical Chemistry, Polish Academy of Sciences, Kasprzaka 44/52 01-224 Warszawa, Poland
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We present millikelvin studies of magnetoresistance for epitaxial films and wires of CdTe:In. In comparison to the data with theoretical predictions for the weakly localized regime we put into the evidence the presence of the temperature-induced dimensional crossovers in the studied systems. Our measurements probe the electron phase-breaking rate and indicate that the main dephasing mechanism arises from electron scattering from thermal fluctuations of three- or two-dimensional electron liquid.
DOI: 10.12693/APhysPolA.90.1027
PACS numbers: 71.55.Jv