Doping Properties of Amphoteric C, Si, and Ge Impurities in GaN and AlN
P. Boguslawskia,b and J. Bernholcb
aInstitute of Physics, Polish Academy of Sciences, Al. Lotników 32/46, 02-668 Warsaw, Poland
bDepartment of Physics, North Carolina State University, Raleigh, NC 27695, USA
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Electronic structure of substitutional group-IV impurities C, Si, and Ge in hexagonal GaN and AlN were studied by quantum molecular dynamics. CN is a very shallow acceptor, and thus a promising p-type dopant. Both Si and Ge are excellent donors in GaN. However, in AlGaN alloys the DX configurations are stable for a sufficiently high Al content, which quenches the doping efficiency. Electronic structure of nearest-neighbor Xcation-XN pairs is also discussed.
DOI: 10.12693/APhysPolA.90.735
PACS numbers: 71.55.-i