Oscillations in Reflectivity of Samples with X-ray Waveguide Layers |
| J.B. Pełkaa, S. Lagomarsinob, S. Di Fonzoc, W. Jarkc and J. Domagałaa aInstitute of Physics, Polish Academy of Sciences, Al. Lotników 32/46, 02-668 Warszawa, Poland bIstituto di Elettronica dello Stato Solido CNR, V. Cineto Romano 42, Roma, Italy cSincrotrone Trieste, Padriciano 99, 34012 Trieste, Italy |
| Full Text PDF |
| The glancing-angle reflectivity profiles in samples containing an X-ray waveguide layer are studied. Oscillations observed at angles within the region of resonance and above, are interpreted by angle dependent interference of the monochromatic X-ray beam in thin layer. The discussion is extended to the structures composed of more than one layer. Experimental reflectivity spectra recorded with Cu Kα radiation are compared with the theoretical calculations. It leads to the model of oscillations in reflectivity consistent both for the resonant and non-resonant regions, and clarifies interpretation of oscillations in the region above the resonances. A brief discussion of potential applications of the reflectivity spectra to the studies of structure of thin layers is done. |
| DOI: 10.12693/APhysPolA.89.323 PACS numbers: 68.65.+g, 78.20.Ci |