Optically Active Centers in Er-Implanted Silicon
H. Przybylińska
Institute of Physics, Polish Academy of Sciences, Al. Lotników 32/46, 02-668 Warszawa, Poland

W. Jantsch, G. Hendorfer, L. Palmetshofer
Institut für Experimentalphysik, Johannes Kepler Universität, 4040 Linz-Auhof, Austria

R.J. Wilson and B.J. Sealy
Department of Electronic and Electrical Engineering, University of Surrey, Guildford, Surrey GU2 5XH, UK
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We show that of all the optically active Er centers in silicon found after ion implantation and optimum annealing (900°C) the isolated cubic interstitial Er is the dominant PL center above 100 K. At lower anneal temperatures ( ≈ 600°C) with later rapid thermal anneal at 900°C oxygen related centers also emit.
DOI: 10.12693/APhysPolA.88.877
PACS numbers: 78.55.Hx