Indium Doping of CdTe Grown by Molecular Beam Epitaxy
G. Karczewski, A. Zakrzewski, M. Kutrowski, J. Jaroszyński, W. Dobrowolski, E. Grodzicka, E. Janik, T. Wojtowicz, J. Kossut
Institute of Physics, Polish Academy of Sciences, Al. Lotników 32/46, 02-668 Warszawa, Poland

and A. Barcz
Institute of Electron Technology, Al. Lotników 32/46, 02-668 Warszawa, Poland
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We report on n-type indium doping of CdTe films grown by molecular beam epitaxy on (001) GaAs substrates. By adjusting the flux of In atoms we can precisely control the carrier concentration over three orders of magnitude - from 8 × 1014 up to 1.3 × 1018 cm-3. In agreement with earlier reports we confirmed that Cd overpressure plays an important role in the doping process. The doping appears to be most effective for Cd/Te pressure ratio of 1.5. For this value of Cd/Te pressure ratio essentially 100% efficiency of doping is achieved at low In concentrations (< 1018 cm-3). At higher In concentrations acceptor impurities compensate shallow donors limiting the concentration of free carriers.
DOI: 10.12693/APhysPolA.87.241
PACS numbers: 68.55.Ln, 73.61.Ga