Electrical and Optical Characterization of Nanostructures |
E. Gornik, J. Smoliner and V. Rosskopf Technische Universität Wien, Institut für Festkörperelektronik 362, Gußhausstraße 25-29, 1040 Wien, Austria |
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The characterization of nanostructures is a topic of vital interest, since the dimensions of commercially available semiconductor devices are now in a range, where quantum size effects become evident. In this paper, various methods are presented to characterize low-dimensional structures. Magnetic depopulation, tunneling, far infrared transmission, photo-conductivity and magnetophonon resonances are used to determine the low-dimensional sub-band energies. For each method, the special features are discussed and it is demonstrated that the different methods yield different, complementary information. |
DOI: 10.12693/APhysPolA.87.119 PACS numbers: 73.20.Dx |