Core Level Spectroscopy at Surfaces and Interfaces
F.J. Himpsel
IBM Research Division, Thomas J. Watson Research Center, P.O. Box 218, Yorktown Heights, NY 10598, USA
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This article provides the basics of core level photoelectron spectroscopy, together with applications in the area of semiconductors. The use of synchrotron radiation is emphasized, particularly the opportunities that are opening up at the new, third generation light sources.
DOI: 10.12693/APhysPolA.86.771
PACS numbers: 73.20.-r