Free-Electron Analysis of Optical Properties of Thermally Evaporated Gold Films |
| N. El-Kadry Physics Department, Minia University, El-Minia, Egypt |
| Received: November 3, 1993 |
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| Gold films of thicknesses 150-300 Å were deposited on quartz substrata using vacuum evaporation technique. Spectrophotometric measurements of transmission T and reflection R at normal incidence were performed in the range 0.4-3.0 µm. The real and imaginary parts of the complex refractive index ñ were determined using a developer algorithm bashed on Murmann's exact equations. The accuracy in the determined n and k was found to be ±6.0% and ±1.6%, respectively. The dispersion curve of n slowed an anomalous dispersion in the visible region characterized by a peak at λ = 0.840 µm. The dielectric constants were calculated and presented. The Drude model parameters ωp and ωτ and d.c. conductivity were determined and compared. The results showed that such parameters could be obtained from free-electron analysis for the near IR experimental results and the intraband transition contributes significantly to the dielectric functions. |
| DOI: 10.12693/APhysPolA.86.375 PACS numbers: 78.66.Bz, 78.30.Er |