X-Ray Photoelectron Spectroscopy and X-Ray Diffraction Studies of Zn1-xCoxS Diluted Magnetic Semiconductor Crystals
K. Ławniczak-Jabłońska, Z. Gołacki, W. Paszkowicz, R.J. Iwanowski
Institute of Physics, Polish Academy of Sciences, Al. Lotników 32/46, 02-668 Warszawa, Poland

L.-S. Johansson and M. Heinonen
Department of Applied Physics, University of Turku, ElectroCity, Tykistokatu 2 D, 20520 Turku, Finland
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X-ray photoelectron spectroscopy and powder X-ray diffraction studies of diluted magnetic semiconducting alloys Zn1-xCoxS, in the composition range 0 ≤ x ≤ 0.18, were performed. The analysis of XPS spectra has shown that admixture of Co into ZnS lattice does not affect the shape and position of Zn 2p core level, whereas certain modification of the S 2p peak shape was observed. The detected binding energy of Co indicated similarity between Co-S and Co-O bond structure. Significant contributions of Co 3d7 electrons to the valence band density of states were revealed.
DOI: 10.12693/APhysPolA.84.633
PACS numbers: 79.60.-i, 71.20.Fi