On the Symmetry of the Sulfur Pair-Related Defect in Silicon
M.T. Bennebroeka, A. Zakrzewskib, A.M. Frensa and J. Schmidta
aHuygens Laboratorium, P.O. Box 9504, 2300 Leiden, The Netherlands
bInstitute of Physics, Polish Academy of Sciences, Al. Lotników 32/46, 02-668 Warszawa, Poland
Full Text PDF
A sulfur-related-pair defect in silicon has been studied with optically detected magnetic resonance spectroscopy. Measurement of the angular dependence of the optically detected magnetic resonance signals supplemented by the analysis of the spectrum "quality" yield to the conclusion that the point group symmetry of the defect studied is C1h.
DOI: 10.12693/APhysPolA.84.725
PACS numbers: 76.30.Lh, 71.55.Ht