X-Ray and Electron-Optical Characterization of ZnSe(Co) Crystal with Natural Face

J. Auleytnera, J. Domagałaa, Z. Gołackia, M. Pawłowskab, J. Pełkaa and K. Regińskia aInstitute of Physics, Polish Academy of Sciences, Al. Lotników 32/46, 02-668 Warszawa, Poland bInstitute of Electronic Materials Technology, CEMI, Wólczyńska 133, 01-919 Warszawa, Poland

Received: December 11, 1992; revised version: April 14, 1993

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Using complementary X-ray and electron-optical methods, a ZnSe(Co) crystal with natural face was investigated. X-ray diffraction methods such as double-crystal X-ray reflection topography, double-crystal diffractometry for rocking curve measurements, precise lattice constant measurements by the Bond technique were used for crystal structure characterization and X-ray fluorescence method for studies of chemical composition along the crystal. The scanning electron microscopic image of the crystal surface and reflection diffraction of the high-energy electrons enriched the crystal structure characterization. It was shown that X-ray characterization and reflection high-energy electron diffraction can be regarded as very important complementary tools for non-destructive investigation of the ZnSe(Co) crystal surface layers.

DOI: 10.12693/APhysPolA.83.759 PACS numbers: 61.10.-i, 61.14.Hg, 61.16.Bg