Thin Films Investigations by Means of Spin-Wave Resonance
A.Z. Maksymowicz
Institute of Computer Science, Academy of Mining and Metallurgy, Al. Mickiewicza 30, 30-059 Kraków, Poland

L.J. Maksymowicz
Institute of Electronics, Academy of Mining and Metallurgy, Al. Mickiewicza 30, 30-059 Kraków, Poland

and J.S.s. Whiting
Department of Physics, University of York, York Y01 5DD, England
Received: March 21, 1991
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Magnetic resonance technique may successfully be applied to determine some basic parameters such as g-factor, magnetization Ms or anisotropy energy constant Ku in thin magnetic films. These parameters are obtained from a ferromagnetic resonance experiment when uniform precession of Ms takes place. From spin-wave resonance one may extract very valuable information on the exchange constant A or the surface conditions characterized by the surface anisotropy energy (or pinning parameters ρ). In fact, it is only spin-wave resonance or similar techniques which allow for measurements of A, ρ or the coupling constant Kc between ferromagnetic sublayers in multi-layered structure. The magnetic phase diagram, temperature dependence of the spin-waves stiffness constant, and the anisotropy energy constant may also be listed as less common examples of spin-wave resonance technique application for the investigation of thin films. This paper presents a theoretical approach to typical examples of experimental results and their interpretation from spin-wave resonance measurements.
DOI: 10.12693/APhysPolA.80.665
PACS numbers: 76.50.+g, 76.30.-v, 73.90.+f