Point-Contact I-V Characteristics of the Electroluminescent ZnS:Mn,Cu Thin Films Studied by STM |
| S. Szuba, R. Czajka, W.S. Gordon, W. Polewska, Institute of Physics, Poznań Technical University, Piotrowo 3, 60-965 Poznań, Poland J. Raułuszkiewicz and A. Reich Institute of Physics, Polish Academy of Sciences, Al. Lotników 32/46, 02-668 Warszawa, Poland |
| Received: August 8, 1990 |
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| STM images of ZnS:Mn,Cu thin films and spatially resolved current-voltage characteristics are shown. The results make possible to estimate the morphology and conductivity distribution with nanometer resolution. |
| DOI: 10.12693/APhysPolA.79.171 PACS numbers: 72.80.Ey, 73.40.Gk, 73.60.Fw |