Passivation of a Bulk Defect Ec-0.22 eV in GaAs by Contact with Phosphoric Acid
A. Babiński and E. Gołdys
Institute of Experimental Physics, Warsaw University, Hoża 69, 00-681 Warszawa, Poland
Received: August 8, 1990
Full Text PDF
The Ec-0.22 eV trap in Horizontal Bridgman undoped n-type GaAs may be passivated by contact with phosphoric acid for 8 hours at room temperature. Isochronal annealing, at around 250°C for 1 hour resulted in the partial recovery of this defect. The possible mechanisms of Ec-0.22 eV trap passivation are proposed.
DOI: 10.12693/APhysPolA.79.277
PACS numbers: 71.55.Eq, 81.60.Cp, 61.70.At