Phase Formation and Structural Analysis via X-Ray Diffraction: Insights into Material Stability and Properties

N.A. Sideka, N.I.M. Nadzria, b, N.H.B. Ramlic, A.S. Sangara, b, D.S.C. Halind, S. Josephe, V.D. Vuonge aCentre of Excellence Geopolymer and Green Technology (CEGeoGTech), Faculty of Chemical Engineering Technology, Universiti Malaysia Perlis (UniMAP), Taman Muhibbah, 02600, Arau, Perlis, Malaysia bFaculty of Chemical Engineering and Technology, University Malaysia Perlis (UniMAP), Kompleks Pusat Pengajian Jejawi 2, Taman Muhibbah, 02600 Jejawi, Arau, Perlis, Malaysia cFaculty of Electronic Engineering and Technology, University Malaysia Perlis (UniMAP), Kompleks Pusat dDepartment of Materials Engineering, Cambridge Institute of Technology, Bengaluru, Karnataka 560036, India eDepartment of Energy Materials, Faculty of Materials Technology, Ho Chi Minh City University of Technology (HCMUT), 268 Lý Thường Kiệt Phường, Quận 10, Thành phố Hồ Chí Minh, Vietnam

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This review investigates thin films of CoCr-based high-entropy alloys, focusing on their contributions to physics through the study of phase formation and their analysis using X-ray diffraction. By leveraging the principles of crystallography and solid-state physics, the project addresses critical challenges in understanding phase transitions and microstructural evolution in CoCr-based high-entropy alloy system. X-ray diffraction provides key insights on lattice parameters, crystallite size, and strain, linking these parameters to material properties and stability. The integration of computational modeling and experimental techniques emphasizes the project's role in advancing knowledge of phase behavior and its applications in automotive, hard coatings, and even semiconductor. This concise assessment highlights the importance of X-ray diffraction-driven studies in shaping future directions in materials science and physics research.

DOI:10.12693/APhysPolA.147.258 topics: high-entropy alloy (HEA), X-ray diffraction (XRD), phase structure, thin films