Nanometric z-Profiling of Bio-Chromophore Layers by DRLS

S. Popescu, A. Peled Photonics Laboratory, Holon Institute of Technology, Holon 5810201, Israel

Received: January 10, 2020; in final form April 6, 2020

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The differential reflected light scattering technique provides a nondestructive, far field optical back-scattering measurement method with z-thickness profiling capabilities over large areas. The phenomenological theory and experimental examples of thickness profiling and structural evaluation of photodeposited organic materials layers assisted by bio-chromophores are described in this work.

DOI:10.12693/APhysPolA.137.1163 topics: differential reflected light, nanolayers, light scattering, optical nanoscopy, chromophores, photodeposition\\vs*{10pt}