ACTA

Near-Edge X-Ray Absorption Fine Structure Spectroscopy of Agarose with a Compact Laser Plasma Soft X-Ray Source

T. Fok^a, P. Wachulak^a, K. Janulewicz^a, M. Duda^b, Ł. Węgrzyński^a, A. Bartnik^a, R. Jarocki^a, H. Fiedorowicz^a
^aInstitute of Optoelectronics, Military University of Technology, S. Kaliskiego 2, 00-908 Warsaw 49, Poland
^bFaculty of Nuclear Sciences and Physical Engineering, Czech Technical University in Prague, Břehová 78/7, 115 19 Prague, Czech Republic

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In this work, we demonstrate near-edge X-ray absorption fine structure spectroscopy of agarose with a compact laboratory laser-plasma soft X-ray source. The source is based on a double stream gas puff target irradiated by nanosecond laser pulses. The emission spectra of the source and the absorption spectra of the investigated sample were measured simultaneously using a flat-field spectrometer. Soft X-ray emission from a krypton/helium target in the range between 1.5 and 5 nm was applied as the source. The transmission measurements revealed the specific spectral features near the carbon K-α absorption edge corresponding well to the results obtained with synchrotron radiation.

DOI:10.12693/APhysPolA.137.51
topics: soft x-rays, spectroscopy, absorption