Spectral Investigation of Laser Plasma Sources for X-Ray Coherence Tomography
A. Arikkatt, P. Wachulak, A. Bartnik, H. Fiedorowicz
Institute of Optoelectronics, Military University of Technology, S. Kaliskiego 2, 00-908 Warsaw, Poland
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We present spectral investigations of laser-plasma sources, in the extreme ultraviolet (EUV) and soft X-ray (SXR) regions from high-Z gases, dedicated for the X-ray coherence tomography experiments. The laser pulses of 4 ns and 650 mJ are used to produce plasma in a double gas puff target. The spectral investigation is done using 3 different spectrometers, spanning 1 nm to 70 nm of the EUV/SXR spectral region. Grazing incidence spectrometers are used in the ranges of 1-5 nm and 10-70 nm, and transmission grating spectrometer is used in the range of 4-16 nm. Specific wavelength bands were identified which are suitable for SXR and EUV XCT measurements. The compact size of the experimental setup of about ~1.5×1.5 m2 makes it suitable for laboratory environments.

DOI:10.12693/APhysPolA.137.48
PACS numbers: 32.30.Rj, 42.62.Fi, 52.38.-r, 52.50.Dg, 52.50.Jm, 87.64.Gb