Multi-Analytical Study of Degradation Processes in Perovskite Films for Optoelectronic Applications |
| V. Travkin, G. Pakhomov, P. Yunin, M. Drozdov
Institute for Physics of Microstructures of Russian Academy of Sciences (IPM RAS), Nizhny Novgorod, Russian Federation |
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| The combination of three instrumental techniques: optical spectroscopy/microscopy, X-ray diffraction and mass-spectrometry (ToF-SIMS with depth profiling) was used to analyze the time, temperature and light induced degradation in thin films of the perovskite-type materials. Hybrid perovskite (MAPbI3) and inorganic perovskite (CsPbI3) films were obtained by a thermal vacuum evaporation and subjected to illumination by the continuous and monochromatic light. Photoelectrical measurements were carried out on the multilayer devices, in which perovskite was sandwiched between CuI hole transporting and C60 electron transporting layers. |
DOI:10.12693/APhysPolA.135.1039 topics: perovskite, morphology, vacuum deposition, photovoltaic cells, degradation |