ACTA

XPS Study of Te-protected Surface of Sn_1-xMn_xTe Topological Crystalline Insulator

I.N. Demchenko^a, Y. Syryanyy^b, M. Zięba^a, R. Minikayev^a, E. Łusakowska^a, M. Wiater^a, P. Konstantynov^a, T. Wojtowicz^c, T. Story^a
^aInstitute of Physics, Polish Academy of Sciences, Aleja Lotnikow 32/46, PL-02668 Warsaw, Poland
^bFaculty of Chemistry, Biological and Chemical Research Centre UW, Żwirki i Wigury 101, PL-02689 Warsaw, Poland
^cInternational Research Centre MagTop, Institute of Physics, Polish Academy of Sciences, Aleja Lotnikow 32/46, PL-02668 Warsaw, Poland

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We present X-ray photoelectron spectroscopy studies of epitaxial layers of Sn_0.95Mn_0.05Te/CdTe/GaAs(001) - a ferromagnetic topological crystalline insulator. We demonstrate that by terminating the molecular beam epitaxy growth of the layer with 20 nm crystalline Te cap one can protect the layer against oxidation at ambient conditions and, after short thermal annealing in X-ray photoelectron spectroscopy chamber, obtain atomically clean (001) surface of high crystal quality, suitable for angle-resolved photoelectron spectroscopy studies of surface topological states.

DOI:10.12693/APhysPolA.134.937
PACS numbers: 73.20.At, 75.50.Pp, 82.80.Pv