Defect Range and Evolution in Swift Xe-Ion Irradiated Pure Silver Studied by Positron Annihilation Technique

J. Dryzeka, P. Horodeka,b and V.A. Skuratovb,c,d aInstitute of Nuclear Physics, Polish Academy of Sciences, PL-31342 Kraków, Poland bJoint Institute for Nuclear Research, Joliot-Curie 6, 141980 Dubna, Moscow region, Russia cNational Research Nuclear University MEPhI, Kashirskoye sh. 31, 115409 Moscow, Russia dDubna State University, Universitetskaya 19, 141980 Dubna, Moscow region, Russia

Full Text PDF

Variable energy positron beam and positron lifetime spectroscopy were used to study pure silver samples exposed to irradiation with swift Xe26+ ions of energy 167 MeV with different dose: of 1013, 5×1013 and 1014 ions/cm2. The positron lifetime spectroscopy revealed the presence of dislocations or vacancies associated with dislocations. They are distributed at the depth of about 6 μm, and this correlates with the ion implantation range, i.e. 9 μm. However, some defects are observed also to a depth of about 18 μm. At the depth less than 1 μm from the entrance surface strong dependence of positron diffusion length on the dose is observed. It indicates the presence of interstitial atoms and/or dislocation loops as a result of Xe26+ ions implantation.

DOI: 10.12693/APhysPolA.132.1585 PACS numbers: 61.80.Jh, 61.82.Bg, 78.70.Bj