Defect Range and Evolution in Swift Xe-Ion Irradiated Pure Silver Studied by Positron Annihilation Technique
J. Dryzeka, P. Horodeka,b and V.A. Skuratovb,c,d
aInstitute of Nuclear Physics, Polish Academy of Sciences, PL-31342 Kraków, Poland
bJoint Institute for Nuclear Research, Joliot-Curie 6, 141980 Dubna, Moscow region, Russia
cNational Research Nuclear University MEPhI, Kashirskoye sh. 31, 115409 Moscow, Russia
dDubna State University, Universitetskaya 19, 141980 Dubna, Moscow region, Russia
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Variable energy positron beam and positron lifetime spectroscopy were used to study pure silver samples exposed to irradiation with swift Xe26+ ions of energy 167 MeV with different dose: of 1013, 5×1013 and 1014 ions/cm2. The positron lifetime spectroscopy revealed the presence of dislocations or vacancies associated with dislocations. They are distributed at the depth of about 6 μm, and this correlates with the ion implantation range, i.e. 9 μm. However, some defects are observed also to a depth of about 18 μm. At the depth less than 1 μm from the entrance surface strong dependence of positron diffusion length on the dose is observed. It indicates the presence of interstitial atoms and/or dislocation loops as a result of Xe26+ ions implantation.

DOI: 10.12693/APhysPolA.132.1585
PACS numbers: 61.80.Jh, 61.82.Bg, 78.70.Bj