Magnetic and Structural Studies of GeMnSnTe Epitaxial Layers
A. Grochota, W. Knoff a, B. Taliashvili a, W. Wołkanowicz a, R. Minikayev a, A. Pieniążek a, E. Łusakowska a, M. Sawicki a, W. Jantsch b, T. Story a and H. Przybylińska a
aInstitute of Physics, Polish Academy of Sciences, aleja Lotnikow 32/46, PL-02668 Warsaw, Poland
bInstitute of Semiconductor and Solid State Physics, Johannes Kepler University, Linz, Austria
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MBE grown Ge1-x-yMnxSnyTe layers with Mn content ranging from 10 to 30% and Sn content ranging from 2 to 5% have been characterized with X-ray diffraction, energy-dispersive X-Ray spectroscopy, atomic force microscopy, SQUID magnetometry, and ferromagnetic resonance. All layers (except the one with the highest Mn and Sn content) were found to be single phase rhombohedral, with the distortion axis perpendicular to the layer surface, and ferromagnetic. Ferromagnetic resonance studies have shown that co-doping with a few percent of tin makes the lattice more rigid and changes considerably the magnetocrystalline anisotropy, from purely uniaxial in GeMnTe to distorted cubic in Ge1-x-yMnxSnyTe at the same Mn content.

DOI: 10.12693/APhysPolA.132.340
PACS numbers: 75.30.Gw, 75.50.Pp, 76.50.+g