Synthesis, Roentgenophase Analysis and Physical Properties of TlIn1-xErxSe2 Solid Solutions
S.N. Mustafaeva, E.M. Kerimova and A.I. Gasanov
Institute of Physics, ANAS, AZ-1143, G. Javid Pr., 131, Baku, Azerbaijan
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The results of high-frequency dielectric measurements on obtained TlIn1-xErxSe2 single crystals provided an opportunity to determine the mechanisms of dielectric losses and charge transport, and also to evaluate the density of states at the Fermi level; The average time of charge carrier hopping between localized states, average hopping distance, scattering of trap states near the Fermi level; Concentration of deep traps.

DOI: 10.12693/APhysPolA.128.697
PACS numbers: 71.20.Eh, 71.20.-b, 71.20.Nr, 71.55.-i, 72.15.Eb, 72.15.Rn, 72.20.-i, 72.20.Ee, 72.20.Jv, 72.30.+q