Evaluation of Refractive Index Variations of TiO2:SiO2:Zr Thin Films by Molar Ratio
Z.B. Bahsi Oral
Gebze Technical University, Department of Environmental Engineering, PK:141 41400 Gebze/Kocaeli, Turkey
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Zr-doped and undoped TiO2-SiO2 thin films were fabricated by using sol-gel dip coating. TiO2:SiO2:Zr films with different molar ratio were coated on glass substrates. Refractive indexes and the thicknesses of thin films were measured with Metricon 2010 Prism Coupler. The theoretical and measured refractive indexes of thin films were found to be consistently changing with molar ratio. The measured refractive indexes of thin films were lower than the theoretical ones due to the porosity of the structure.

DOI: 10.12693/APhysPolA.127.1314
PACS numbers: 81.20.Fw