Thermal Fluctuations of Bismuth Based 1G Tape
M. Chrobak, W.M. Woch, R. Zalecki and A. Ko┼éodziejczyk
AGH University of Science and Technology, Faculty of Physics and Applied Computer Science, Solid State Physics Department, al. A. Mickiewicza 30, 30-059 Cracow, Poland
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The thermal fluctuations of bismuth based commercial 1G tape were studied near the critical temperature Tc=110.2 K. The detailed analysis of the temperature dependence of resistivity measurements was made in the temperature region from the zero resistance critical temperature up to 300 K. The thermal fluctuations of conductivity were analysed using the Aslamazov-Larkin microscopic approach and the critical exponents were calculated close to the transition temperature.

DOI: 10.12693/APhysPolA.127.306
PACS numbers: 74.72.-h, 74.78.-w, 74.40.-n, 74.62.-c