Penetration Depth of Magnetic Field into YBa2Cu3Ox Film on Polycrystalline Ag Substrate
R. Zalecki, W.M. Woch, M. Chrobak and A. Kołodziejczyk
AGH University of Science and Technology, Faculty of Physics and Applied Computer Science, Solid State Physics Department, Cracow, Poland
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The magnetic field penetration depth into YBa2Cu3Ox film on polycrystalline Ag substrate with the critical temperature of 90.4 K was determined from the AC susceptibility measurements. The 95 μ m thick YBCO film was deposited directly on Ag substrate by the sedimentation process. When the sample is in the Meissner state, the dispersive component of the AC susceptibility as well as its temperature dependence reflects the changes of the penetration depth with the temperature. The penetration depth of this film is found to be 5.4 μ m.

DOI: 10.12693/APhysPolA.127.272
PACS numbers: 74.72.-h, 74.25.Ha, 74.25.Wx, 74.20.De