Confocal Microscope Studies of MoS2 Layer Thickness |
| M. Grzeszczyk, K. Gołasa, B. Piętka, A. Babiński and J. Szczytko
Nanostructures Engineering, Institute of Experimental Physics, Faculty of Physics, University of Warsaw, Pasteura 5, 02-093 Warszawa, Poland |
| Full Text PDF |
| We have been studying micro-luminescence of various exfoliated MoS2 flakes using a confocal microscope. A crucial issue is to determine thickness of the investigated layer. The common way - using atomic force microscopy, electron microscopy or the Raman spectroscopy - requires moving the sample out from the confocal microscope experimental setup and looking for a particular exfoliated flake hidden among thousands of others. In order to preliminarily determine thickness of investigated layers we have performed a study on optical reflectivity and compared the results with the Raman spectroscopy investigations. In this way we were able to calibrate our experimental setup. Optical measurements are much faster than the Raman spectroscopy and can give a good estimation of MoS2 thickness. |
DOI: 10.12693/APhysPolA.126.1207 PACS numbers: 78.20.Ci, 63.20.dd, 78.30.-j, 78.66.Li |