Influence of Annealing Temperature on Y2O3:SiO2 Nanocomposite Prepared by Sol-Gel Process |
| R. Ahlawat and P. Aghamkar
Department of Physics, Materials Science Lab., Ch. Devi Lal University, Sirsa-125055, Haryana, India |
| Received: February 22, 2013; In final form: May 15, 2014 |
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| Oxide nanoparticles embedded in a polymer matrix produce nanocomposites which are useful for optics and electronic applications. Yttrium oxide nanoparticles have received much attention due to their various properties and are significantly used in fundamental and application oriented fields. The present paper reports the influence of annealing temperature on the Y2O3:SiO2 nanocomposite prepared by sol-gel process. Y(NO3)3·4H2O and tetra-ethoxy-silane were used as precursors and obtained powdered form of Y2O3:SiO2 composite. The powder sample was annealed at 500°C and 900°C for 6 h which were characterized by X-ray diffraction, Fourier transform infrared and transmission electron microscope. X-ray diffraction data described that the broadening of peaks decreases with increase in annealing temperature which may be due to the increase in particle size. Sample analyzed by Fourier transform infrared and transmission electron microscopy confirmed the grain size dependence on annealing temperature. Cubic phase of yttrium oxide crystal structure was obtained within the silica matrix. The nanocrystallites size has been calculated using Debye-Scherrer formula, Williamson-Hall plot and transmission electron micrographs and compared at two different temperatures (a) 500°C and (b) 900°C. |
DOI: 10.12693/APhysPolA.126.736 PACS numbers: 61.46.Bc, 61.46.Df, 78.67.Bf |